Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair

Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.\nFunctional Design Errors in Digital Circuits: Diagnosis Correction and Repair is written by Kai-hui Chang; Igor L. Markov; Valeria Bertacco and published by Springer. ISBNs for Functional Design Errors in Digital Circuits are 9781402093654, 1402093659 and the print ISBNs are 9789048181124, 9048181127. Additional ISBNs include 9781402093647.