Introduction to Scanning Tunneling Microscopy

Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science.\n\nThis book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.Introduction to Scanning Tunneling Microscopy 1st Edition is written by C. Julian Chen and published by Oxford University Press. ISBNs for Introduction to Scanning Tunneling Microscopy are 9780198023562, 0198023561 and the print ISBNs are 9780195071504, 0195071506.