Nanometrology Using the Transmission Electron Microscope

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.Additional ISBNs1681740567, 1643278029, 9781681740560, 9781643278025Nanometrology Using the Transmission Electron Microscope is written by Vlad Stolojan and published by IOP Concise Physics. ISBNs for Nanometrology Using the Transmission Electron Microscope are 9781681741208, 1681741202 and the print ISBNs are 9781681740560, 1681740567. Additional ISBNs include 1681740567, 1643278029, 9781681740560, 9781643278025.