

Spatial Point Patterns: Methodology and Applications with R
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Spatial Point Patterns: Methodology and Applications with R
$30.00
Modern Statistical Methodology and Software for Analyzing Spatial Point Patterns Spatial Point Patterns: Methodology and Applications with R shows scientific researchers and applied statisticians from a wide range of fields how to analyze their spatial point pattern data.\n\nMaking the techniques accessible to non-mathematicians, the authors draw on th Additional ISBNs1482210207, 0429161700, 9781482210200, 9780429161704Spatial Point Patterns: Methodology and Applications with R 1st Edition is written by Adrian Baddeley; Ege Rubak; Rolf Turner and published by Chapman & Hall. ISBNs for Spatial Point Patterns are 9781482210217, 1482210215 and the print ISBNs are 9781482210200, 1482210207. Additional ISBNs include 1482210207, 0429161700, 9781482210200, 9780429161704.
Product Details
TypeNew Arrivals
SKUGC-8684667105
TagsNew Arrivals
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